Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M., & Hamdioui, S. (2019). Device-Aware Test: A New Test Approach Towards DPPB Level. In 2019 IEEE International Test Conference, ITC 2019 Article 9000134 (Proceedings – International Test Conference; Vol. 2019-November). IEEE. https://doi.org/10.1109/ITC44170.2019.9000134
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